Material Technology

Scanning Electron Microscope

Scanning Electron Microscopy is used to characterise surface topography (unique depth definition), micro-structure, element composition, and to take pictures with magnification in the range of 10 to 100 000.
Contact

Furuseth, Trygve

Project Engineer

Seiersten, Marion

Deputy Head of Department / Chief Scientist

 
  • Damage analysis: Fractures, wear and tear, erosion
  • Corrosion: Characterization of corrosion products, determination of the extent of the damage, estimate corrosion- and wear and tear damages
  • Process control: Particle analysis, deposition analysis, filter analysis
  • Material definition: Metals, plastics, coating, wood
  • Element analysis: All elements with atomic number larger or equal to 6 (which is carbon), average analysis, point analysis (1µm resolution), element mapping of surfaces and cross sections
  • Analysis of micro-structure: Phase determination, characterization of structure

More SEM specifications

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Katerina Bilkova and Trygve Furuseth working with the microscope

Case 1: Characterization of micro-structure

Electron beam welding is used to join AISI 316 and Inconel 82.

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Etched silisium

There are visible segregations in the welding and the heat affected area. In the heat affected area the grain structure is clearly visible because of the segregation in the grain borders.

 

Case 2: Element analysis

The picture below shows particles filtrated from a liquid flow in a process plant. The size and shapes of the particles can be measured and the element compound determinated. The spectras shows what elements are to be found in the particles.

 

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Salt crystal

 

In face-grinded samples, the element composition can also be determined quantitatively (either by weight % or atomic %).

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Pictures: Weld consisting of different phases. Particles filtrated from a liquid in a process plant

Spectras showing elements to be found in the particles. On the top a salt crystal, and at the bottom a compound sulphate particle.