Ellipsometry and XPS comparative studies of oxidation effects on graded porous silicon antireflection coatings
Selj, J.H.
,
Thøgersen, A.
,
Foss, S.E.
,
Marstein, E.S.
Electrochemical Society - 218th ECS Meeting Abstracts 2010, MA 2010-02, v 2, Abstract 1321
- Publ. year
- 2010
- Publ. type
- paper
- Availabilty
- External link

