Energi og miljø

Ellipsometry and XPS comparative studies of oxidation effects on graded porous silicon antireflection coatings

Selj, J.H. , Thøgersen, A. , Foss, S.E. , Marstein, E.S.
Electrochemical Society - 218th ECS Meeting Abstracts 2010, MA 2010-02, v 2, Abstract 1321
Publ. year
2010
Publ. type
paper
Availabilty
External link
Document Actions